Atomic Scale Investigation of Tin Selenide

dc.contributor.advisorDESHPANDE, APARNAen_US
dc.contributor.authorA, THASNEEMen_US
dc.contributor.departmentDept. of Physicsen_US
dc.contributor.registration20121067en_US
dc.date.accessioned2018-04-19T06:07:50Z
dc.date.available2018-04-19T06:07:50Z
dc.date.issued2017-04en_US
dc.description.abstractSnSe is a p type semiconductor belonging to IV-VI group of chalcogenides. It is a layered material with strong in plane covalent interaction and weak inter layer Van der Waal’s interaction. SnSe in Cmcm phase is known for its highest figure of merit (ZT) value of 2.6 at 923K. This behaviour is attributed to its ultra-low thermal conductivity of around 0.24 W/mK. Even though few studies on surface properties of SnSe are reported, the local electronic property of the sample is not investigated thoroughly. In this work, Scanning Tunnelling Microscopy and Scanning Tunnelling Spectroscopy studies were carried out to understand the local electronic properties of the SnSe at 77K and at 300K. SnSe was synthesized using chemical vapour transport technique and studies were performed on Pnma phase of the crystal. Investigation of intrinsic defects on the single crystal was performed in Ultra High Vacuum Low Temperature Scanning Tunnelling Microscopy.en_US
dc.identifier.urihttp://dr.iiserpune.ac.in:8080/xmlui/handle/123456789/817
dc.language.isoenen_US
dc.subject2017en_US
dc.subjectPhysicsen_US
dc.subjectTin Selenideen_US
dc.subjectAtomic Scaleen_US
dc.titleAtomic Scale Investigation of Tin Selenideen_US
dc.typeThesisen_US
dc.type.degreeBS-MSen_US

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